Author/Creator: Rinaldi, Niccolò - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Rinaldi, Niccolò

1. 3-D thermal models calibration by parametric dynamic compact thermal models. (December 2017)

Authors:: Codecasa, Lorenzo; d'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolò
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 371
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Advanced thermal simulation of SiGe:C HBTs including back-end-of-line. (December 2016)

Authors:: d'Alessandro, Vincenzo; Magnani, Alessandro; Codecasa, Lorenzo; Rinaldi, Niccolò; Aufinger, Klaus
Journal:: Microelectronics and reliability
Issue:: Volume 67(2016)
Page Start:: 38
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization. (August 2018)

Authors:: Rogié, Brice; Codecasa, Lorenzo; Monier-Vinard, Eric; Bissuel, Valentin; Laraqi, Najib; Daniel, Olivier; D'Amore, Dario; Magnani, Alessandro; d'Alessandro, Vincenzo; Rinaldi, Niccolò
Journal:: Microelectronics and reliability
Issue:: Volume 87(2018)
Page Start:: 222
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Partition-based approach to parametric dynamic compact thermal modeling. (December 2017)

Authors:: Codecasa, Lorenzo; d'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolò; Metzger, Andre G.; Bornoff, Robin; Parry, John
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 361
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Simulation comparison of InGaP/GaAs HBT thermal performance in wire-bonding and flip-chip technologies. (November 2017)

Authors:: d'Alessandro, Vincenzo; Catalano, Antonio Pio; Magnani, Alessandro; Codecasa, Lorenzo; Rinaldi, Niccolò; Moser, Brian; Zampardi, Peter J.
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 233
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. Structure-preserving approach to multi-port dynamic compact models of nonlinear heat conduction. Issue 12 (December 2015)

Authors:: Codecasa, Lorenzo; d׳Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolò
Journal:: Microelectronics journal
Issue:: Volume 46:Issue 12 Part A (2015)
Page Start:: 1129
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

7. Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources. (August 2018)

Authors:: Codecasa, Lorenzo; Bornoff, Robin; Dyson, James; d'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolò
Journal:: Microelectronics and reliability
Issue:: Volume 87(2018)
Page Start:: 194
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗