Author/Creator: Reviriego, Pedro - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Reviriego, Pedro

11. Odd‐weight‐column SEC–DED–TAED codes. Issue 2 (1st January 2016)

Authors:: Liu, Shan Shan; Reviriego, Pedro; Sánchez‐Macián, Alfonso; Xiao, Liyi; Maestro, Juan Antonio
Journal:: Electronics letters
Issue:: Volume 52:Issue 2(2016)
Page Start:: 119
Record Type:: Journal Article
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12. Opcode vector: An efficient scheme to detect soft errors in instructions. (July 2018)

Authors:: Martinez, Jorge; Atamaner, Mert; Reviriego, Pedro; Ergin, Oguz; Ottavi, Marco
Journal:: Microelectronics and reliability
Issue:: Volume 86(2018)
Page Start:: 92
Record Type:: Journal Article
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13. Reliability evaluation of FPGA based pruned neural networks. (March 2022)

Authors:: Gao, Zhen; Yao, Yi; Wei, Xiaohui; Yan, Tong; Zeng, Shulin; Ge, Guangjun; Wang, Yu; Ullah, Anees; Reviriego, Pedro
Journal:: Microelectronics and reliability
Issue:: Volume 130(2022)
Page Start:
Record Type:: Journal Article
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14. Scheme for periodical concurrent fault detection in parallel CRC circuits. Issue 2 (21st January 2020)

Authors:: Li, Jie; Liu, Shanshan; Reviriego, Pedro; Xiao, Liyi; Lombardi, Fabrizio
Journal:: IET computers & digital techniques
Issue:: Volume 14:Issue 2(2020)
Page Start:: 80
Record Type:: Journal Article
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15. Seu and Sefi error detection and correction on a ddr3 memory system. (December 2018)

Authors:: Cóbreces, Ana; Regadío, Alberto; Tabero, Jesús; Reviriego, Pedro; Sánchez-Macian, Alfonso; Maestro, Juan Antonio
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 23
Record Type:: Journal Article
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16. Single Event Transient tolerant Count Min Sketches. (February 2022)

Authors:: Zhu, Jinhua; Jin, Jie; Gao, Zhen; Reviriego, Pedro
Journal:: Microelectronics and reliability
Issue:: Volume 129(2022)
Page Start:
Record Type:: Journal Article
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17. Unequal error protection codes derived from SEC‐DED codes. Issue 8 (1st April 2016)

Authors:: Reviriego, Pedro; Liu, Shan Shan; Sánchez‐Macián, Alfonso; Xiao, Liyi; Maestro, Juan Antonio
Journal:: Electronics letters
Issue:: Volume 52:Issue 8(2016)
Page Start:: 619
Record Type:: Journal Article
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