Scheme for periodical concurrent fault detection in parallel CRC circuits. Issue 2 (21st January 2020)
- Record Type:
- Journal Article
- Title:
- Scheme for periodical concurrent fault detection in parallel CRC circuits. Issue 2 (21st January 2020)
- Main Title:
- Scheme for periodical concurrent fault detection in parallel CRC circuits
- Authors:
- Li, Jie
Liu, Shanshan
Reviriego, Pedro
Xiao, Liyi
Lombardi, Fabrizio - Abstract:
- Abstract : As technology scales down, circuits are more prone to incur in faults and fault detection is necessary to ensure the system reliability. However, fault‐detection circuits are also vulnerable to stuck‐at faults due to, for example, manufacturing defects or ageing; a fault can cause an incorrect output in the fault‐detection scheme; so concurrent fault detection is, therefore, needed. Cyclic redundancy checks (CRCs) are widely used to detect errors in many applications, for example, they are used in communication to detect errors on transmitted frames. In this study, an efficient method to implement concurrent fault detection for parallel CRC computation is proposed. The scheme relies on using a serial CRC computation circuit that is used to periodically check the results obtained from the main module to detect the faults. This introduces a lower circuit overhead than existing schemes. All CRC encoders and decoders that implement the CRC computation in parallel can employ the proposed scheme to detect faults.
- Is Part Of:
- IET computers & digital techniques. Volume 14:Issue 2(2020)
- Journal:
- IET computers & digital techniques
- Issue:
- Volume 14:Issue 2(2020)
- Issue Display:
- Volume 14, Issue 2 (2020)
- Year:
- 2020
- Volume:
- 14
- Issue:
- 2
- Issue Sort Value:
- 2020-0014-0002-0000
- Page Start:
- 80
- Page End:
- 85
- Publication Date:
- 2020-01-21
- Subjects:
- error detection codes -- cyclic redundancy check codes -- fault diagnosis -- redundancy -- circuit reliability -- logic circuits
periodical concurrent fault detection -- parallel CRC circuits -- fault‐detection circuits -- fault‐detection scheme -- parallel CRC computation -- serial CRC computation circuit -- cyclic redundancy checks -- system reliability -- manufacturing defects -- ageing -- stuck‐at faults -- error detection -- concurrent fault detection -- circuit overhead -- CRC encoders -- CRC decoders
Computers -- Periodicals
Digital electronics -- Periodicals
Computer engineering -- Periodicals
Computer architecture -- Periodicals
Computer organization -- Periodicals
621.39 - Journal URLs:
- http://digital-library.theiet.org/content/journals/iet-cdt ↗
http://ieeexplore.ieee.org/servlet/opac?punumber=4117424 ↗
http://www.ietdl.org/IET-CDT ↗
https://ietresearch.onlinelibrary.wiley.com/journal/1751861x ↗
http://www.theiet.org/ ↗ - DOI:
- 10.1049/iet-cdt.2018.5183 ↗
- Languages:
- English
- ISSNs:
- 1751-8601
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4363.252300
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 17391.xml