Author/Creator: Reviriego, P. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Reviriego, P.

1. A method to protect Cuckoo filters from soft errors. (May 2017)

Authors:: Reviriego, P.; Pontarelli, S.; Maestro, J.A.
Journal:: Microelectronics and reliability
Issue:: Volume 72(2017)
Page Start:: 85
Record Type:: Journal Article
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2. DMR +: An efficient alternative to TMR to protect registers in Xilinx FPGAs. (August 2016)

Authors:: Reviriego, P.; Demirci, M.; Tabero, J.; Regadío, A.; Maestro, J.A.
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 314
Record Type:: Journal Article
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3. DMR +: An efficient alternative to TMR to protect registers in Xilinx FPGAs. (August 2016)

Authors:: Reviriego, P.; Demirci, M.; Tabero, J.; Regadío, A.; Maestro, J.A.
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 314
Record Type:: Journal Article
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4. Efficient error detection in multiple way tables. Issue 1 (1st January 2015)

Authors:: Reviriego, P.; Maestro, J.A.
Journal:: Electronics letters
Issue:: Volume 51:Issue 1(2015)
Page Start:: 50
Record Type:: Journal Article
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5. Implementing error detection in fast counting Bloom filters. Issue 22 (1st October 2014)

Authors:: Reviriego, P.; Maestro, J.A.
Journal:: Electronics letters
Issue:: Volume 50:Issue 22(2014)
Page Start:: 1602
Record Type:: Journal Article
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6. Implications of energy efficient Ethernet for hubs and switches. (6th December 2010)

Authors:: Reviriego, P.; Maestro, J.A.; Bleakley, C.J.
Journal:: International journal of communication networks and distributed systems
Issue:: Volume 6:Number 1(2011)
Page Start:: 3
Record Type:: Journal Article
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7. Optimised decoding of odd‐weight single error correction double error detection codes with 64 bits. Issue 25 (1st December 2013)

Authors:: Reviriego, P.; Pontarelli, S.; Maestro, J.A.
Journal:: Electronics letters
Issue:: Volume 49:Issue 25(2013)
Page Start:: 1617
Record Type:: Journal Article
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8. Reducing false positives due to double adjacent errors in instruction TLBs. (November 2019)

Authors:: Sánchez-Macián, A.; Aranda, L.A.; Reviriego, P.; Maestro, J.A.
Journal:: Microelectronics and reliability
Issue:: Volume 102(2019)
Page Start:
Record Type:: Journal Article
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