Author/Creator: Pfost, Martin - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Pfost, Martin

1. A comprehensive analytical description of the asymmetric active snubber. Issue 1 (18th August 2022)

Authors:: Schlüter, Michael; Pfost, Martin
Journal:: IET power electronics
Issue:: Volume 16:Issue 1(2023)
Page Start:: 102
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Aging sensors for on-chip metallization of integrated LDMOS transistors under cyclic thermo-mechanical stress. (September 2017)

Authors:: Ritter, Matthias; Pfost, Martin
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 512
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. (September 2017)

Authors:: Oeder, Thorsten; Castellazzi, Alberto; Pfost, Martin
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 321
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Energy capability improvement of power DMOS transistors operating in pulsed conditions. (January 2015)

Authors:: Costachescu, Dragos; Pfost, Martin
Journal:: Solid-state electronics
Issue:: Volume 103(2015)
Page Start:: 140
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Resistance change in on-chip aluminum interconnects under cyclic thermo-mechanical stress. (September 2019)

Authors:: Ritter, Matthias; Pfost, Martin
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. Towards electro-thermo-mechanical lifetime assessment for arbitrary power electronics. (June 2022)

Authors:: Gschwandl, Mario; Friedrich, Birgit; Pfost, Martin; Antretter, Thomas; Fuchs, Peter Filipp; Mitev, Ivaylo; Tao, Qi; Schingale, Angelika
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗