Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. (September 2017)
- Record Type:
- Journal Article
- Title:
- Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. (September 2017)
- Main Title:
- Electrical and thermal failure modes of 600 V p-gate GaN HEMTs
- Authors:
- Oeder, Thorsten
Castellazzi, Alberto
Pfost, Martin - Abstract:
- Abstract: A study of electrical and thermal failure modes of 600 V p-doped GaN HEMTs is presented, which focuses on the investigation of short-circuit limitations. The electrical failure mode seems to be an electrical field breakdown in the structure which is caused by excessive carrier concentration, rather than primary thermal generated. Accordingly, a thermal failure mode is observed, which features a distinctive behaviour and seems to be similar to schottky-gate HEMTs. Concerning the electrical failure mode, a specific p-gate HEMT short-circuit safe operating area (SCSOA) is presented as a novelty. However, a short-circuit capability of up to 520 V can be achieved, regarding the design of the gate-drive circuit. Highlights: A study of electrical and thermal failure modes for GaN HEMTs is presented, which focuses short-circuit limitations. A distinctive behaviour of the electrical and the thermal failure mode is observed. A strong dependence of the short-circuit withstand capability is observed, regarding to the design of the gate-drive circuit. A specific p-gate HEMT short-circuit safe operating area (SCSOA) is presented as a novelty.
- Is Part Of:
- Microelectronics and reliability. Volume 76/77(2017)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 76/77(2017)
- Issue Display:
- Volume 76/77, Issue 2017 (2017)
- Year:
- 2017
- Volume:
- 76/77
- Issue:
- 2017
- Issue Sort Value:
- 2017-NaN-2017-0000
- Page Start:
- 321
- Page End:
- 326
- Publication Date:
- 2017-09
- Subjects:
- Gallium nitride (GaN) -- High electron mobility transistor (HEMT) -- P-doped gate (p-gate) -- Short-circuit -- Safe operating area -- Electrical failure -- Thermal failure
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2017.06.046 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 5681.xml