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Author/Creator Overman, C.T.

1. Development of a 127Xe calibration source for nEXO. (1st July 2022)

Authors:
Lenardo, B.G.; Hardy, C.A.; Tsang, R.H.M.; Nzobadila Ondze, J.C.; Piepke, A.; Triambak, S.; Jamil, A.; Adhikari, G.; Al Kharusi, S.; Angelico, E.; Arnquist, I.J.; Belov, V.; Bernard, E.P.; Bhat, A.; Bhatta, T.; Bolotnikov, A.; Breur, P.A.; Brodsky, J.P.; Brown, E.; Brunner, T.
Journal:
Journal of instrumentation
Issue:
Volume 17:Number 7(2022)
Page Start:
Record Type:
Journal Article
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2. Development of a low-level 37Ar calibration standard. (March 2016)

Authors:
Williams, R.M.; Aalseth, C.E.; Bowyer, T.W.; Day, A.R.; Fuller, E.S.; Haas, D.A.; Hayes, J.C.; Hoppe, E.W.; Humble, P.H.; Keillor, M.E.; LaFerriere, B.D.; Mace, E.K.; McIntyre, J.I.; Miley, H.S.; Myers, A.W.; Orrell, J.L.; Overman, C.T.; Panisko, M.E.; Seifert, A.
Journal:
Applied radiation and isotopes
Issue:
Volume 109(2016:Mar.)
Page Start:
430
Record Type:
Journal Article
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3. Development of a low-level 37Ar calibration standard. (March 2016)

Authors:
Williams, R.M.; Aalseth, C.E.; Bowyer, T.W.; Day, A.R.; Fuller, E.S.; Haas, D.A.; Hayes, J.C.; Hoppe, E.W.; Humble, P.H.; Keillor, M.E.; LaFerriere, B.D.; Mace, E.K.; McIntyre, J.I.; Miley, H.S.; Myers, A.W.; Orrell, J.L.; Overman, C.T.; Panisko, M.E.; Seifert, A.
Journal:
Applied radiation and isotopes
Issue:
Volume 109(2016:Mar.)
Page Start:
430
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

4. Development of a low-level 39Ar calibration standard – Analysis by absolute gas counting measurements augmented with simulation. (August 2017)

Authors:
Williams, R.M.; Aalseth, C.E.; Brandenberger, J.M.; Day, A.R.; Finn, E.; Fuller, E.S.; Hoppe, E.W.; Humble, P.H.; Keillor, M.E.; Mace, E.K.; Myers, A.W.; Overman, C.T.; Panisko, M.E.; Seifert, A.; White, S.K.
Journal:
Applied radiation and isotopes
Issue:
Volume 126(2017:Aug.)
Page Start:
243
Record Type:
Journal Article
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6. Reflectivity of VUV-sensitive silicon photomultipliers in liquid Xenon. (2nd August 2021)

Authors:
Wagenpfeil, M.; Ziegler, T.; Schneider, J.; Fieguth, A.; Murra, M.; Schulte, D.; Althueser, L.; Huhmann, C.; Weinheimer, C.; Michel, T.; Anton, G.; Adhikari, G.; Al Kharusi, S.; Angelico, E.; Arnquist, I.J.; Badhrees, I.; Bane, J.; Beck, D.; Belov, V.; Bhatta, T.
Journal:
Journal of instrumentation
Issue:
Volume 16:Number 8(2021)
Page Start:
Record Type:
Journal Article
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7. Simulation of charge readout with segmented tiles in nEXO. (24th September 2019)

Authors:
Li, Z.; Cen, W.R.; Robinson, A.; Moore, D.C.; Wen, L.J.; Odian, A.; Kharusi, S. Al; Anton, G.; Arnquist, I.J.; Badhrees, I.; Barbeau, P.S.; Beck, D.; Belov, V.; Bhatta, T.; Brodsky, J.P.; Brown, E.; Brunner, T.; Caden, E.; Cao, G.F.; Cao, L.
Journal:
Journal of instrumentation
Issue:
Volume 14:Number 9(2019)
Page Start:
P09020
Record Type:
Journal Article
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8. Study of silicon photomultiplier performance in external electric fields. (17th September 2018)

Authors:
Sun, X.L.; Tolba, T.; Cao, G.F.; Lv, P.; Wen, L.J.; Odian, A.; Vachon, F.; Alamre, A.; Albert, J.B.; Anton, G.; Arnquist, I.J.; Badhrees, I.; Barbeau, P.S.; Beck, D.; Belov, V.; Bhatta, T.; Bourque, F.; Brodsky, J. P.; Brown, E.; Brunner, T.
Journal:
Journal of instrumentation
Issue:
Volume 13:Number 9(2018:Sep.)
Page Start:
T09006
Record Type:
Journal Article
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