1. Advantages of Helium and Neon Ion Beams for Intelligent Imaging. (August 2014) Authors: Wu, Huimeng; Mcvey, Shawn; Ferranti, David; Huynh, Chuong; Notte, John; Stern, Lewis; Joens, Matthew S.; Fitzpatrick, James A. J; Goetze, Bernhard Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 338 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advantages of Helium and Neon Ion Beams for Intelligent Imaging. (August 2014) Authors: Wu, Huimeng; Mcvey, Shawn; Ferranti, David; Huynh, Chuong; Notte, John; Stern, Lewis; Joens, Matthew S.; Fitzpatrick, James A. J; Goetze, Bernhard Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 338 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). (23rd September 2015) Authors: Xia, Deying; Wu, Huimeng; Geotze, Bernhard; Ferranti, David; Stern, Lewis; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1165 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). (August 2015) Authors: Xia, Deying; Wu, Huimeng; Geotze, Bernhard; Ferranti, David; Stern, Lewis; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1165 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Imaging Contrast with Multiple Ion Beams. (23rd September 2015) Authors: Wu, Huimeng; Sijbrandij, Sybren; McVey, Shawn; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 345 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Imaging Contrast with Multiple Ion Beams. (August 2015) Authors: Wu, Huimeng; Sijbrandij, Sybren; McVey, Shawn; Notte, John Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 701 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Light Ion Beams Interacting with Thin Films. (August 2019) Authors: Xia, Deying; Notte, John Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 906 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. NanoFab SIMS: High Spatial Resolution Imaging and Analysis Using Inert-Gas Ion Beams. (8th May 2019) Authors: Sijbrandij, Sybren; Lombardi, Alexander; Sireuil, Alain; Khanom, Fouzia; Lewis, Brett; Guillermier, Christelle; Runt, Doug; Notte, John Journal: Microscopy today Issue: Volume 27:Number 3(2019) Page Start: 22 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. NanoFab SIMS: High Spatial Resolution Imaging and Analysis Using Inert-Gas Ion Beams. (May 2019) Authors: Sijbrandij, Sybren; Lombardi, Alexander; Sireuil, Alain; Khanom, Fouzia; Lewis, Brett; Guillermier, Christelle; Runt, Doug; Notte, John Journal: Microscopy today Issue: Volume 27:Number 3(2019) Page Start: 22 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition (Adv. Mater. Interfaces 28/2022). Issue 28 (4th October 2022) Authors: Xia, Deying; Notte, John Journal: Advanced materials interfaces Issue: Volume 9:Issue 28(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗