Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition (Adv. Mater. Interfaces 28/2022). Issue 28 (4th October 2022)

• Record Type: Journal Article
• Authors: Xia, Deying; Notte, John
• Is Part Of: Advanced materials interfaces. Volume 9:Issue 28(2022)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2022-10-04
• Subjects: branched nanowires -- focused ion beam -- focused ion beam‐induced deposition -- helium ion microscopy -- Ion beam‐induced bending -- kirigami -- neon focused ion beam; Materials science -- Periodicals; 620.11
• DOI: 10.1002/admi.202270155
• Languages: English
• ISSNs: 2196-7350

Abstract

Abstract : Nano‐Kirigami Cutting of the Si3 N4 membrane is performed with a Ne or He FIB. A broad dosage from the Ga FIB then induces bending of the membrane. The He beam is optionally used grow vertical pillars before and after bending. All the images created with the He beam; center scale bar is 200 nm. This is reported by Deying Xia and John Notte in article number 2200696 .