1. (Invited) Advanced Semiconductor Devices for Future CMOS Technologies. (27th March 2015) Authors: Claeys, Cor; Chiappe, Danielle; Collaert, Nadine; Mitard, Jerome; Radu, Juliana; Rooyackers, Rita; Simoen, Eddy; Vandooren, Anne; Veloso, Anabela; Waldron, Niamh; Witters, Liesbeth; Thean, Aaron Journal: ECS transactions Issue: Volume 66:Number 5(2015) Page Start: 49 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures. (1st August 2017) Authors: Loo, Roger; Arimura, Hiroaki; Cott, Daire J.; Witters, Liesbeth; Pourtois, Geoffrey; Schulze, Andreas; Douhard, Bastien; Vanherle, Wendy; Eneman, Geert; Richard, Olivier; Favia, Paola; Mitard, Jerome; Mocuta, Dan; Langer, Robert; Collaert, Nadine Journal: ECS transactions Issue: Volume 80:Number 4(2017) Page Start: 241 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) Generation-Recombination Noise in Advanced CMOS Devices. (19th August 2016) Authors: Simoen, Eddy; Oliveira, Alberto Vinícius de; Boudier, Dimitri; Mitard, Jerome; Witters, Liesbeth; Veloso, Anabela; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Carin, Regis; Cretu, Bogdan; Langer, Robert; Collaert, Nadine; Thean, Aaron; Claeys, Cor Journal: ECS transactions Issue: Volume 75:Number 5(2016) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. (Invited) Heterogeneous Nano- to Wide-Scale Co-Integration of Beyond-Si and Si CMOS Devices to Enhance Future Electronics. (31st March 2015) Authors: Thean, Aaron; Collaert, Nadine; Radu, Iuliana P.; Waldron, Niamh; Merckling, Clement; Witters, Liesbeth; Loo, Roger; Mitard, Jerome; Rooyackers, Rita; Vandooren, Anne; Verhulst, A.; Veloso, Anabela; Yakimets, D.; Bao, T. Huynh; Chiappe, Danielle; Vaysset, A.; Zografos, O.; Caymax, Matty; Huygheba... Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 3 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. (Invited) Processing Technologies for Advanced Ge Devices. (18th August 2016) Authors: Loo, Roger; Hikavyy, Andriy Yakovitch; Witters, Liesbeth; Schulze, Andreas; Arimura, Hiroaki; Cott, Daire; Mitard, Jerome; Porret, Clement; Mertens, Hans; Ryan, Paul; Wall, John; Matney, Kevin; Wormington, Matthew; Favia, Paola; Richard, Olivier; Bender, Hugo; Horiguchi, Naoto; Collaert, Nadine; ... Journal: ECS transactions Issue: Volume 75:Number 8(2016) Page Start: 491 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. (Invited) Si-Cap-Free Low-DIT SiGe Gate Stack for High-Performance pFETs. (8th September 2020) Authors: Arimura, Hiroaki; Wostyn, Kurt; Ragnarsson, Lars-Åke; Conard, Thierry; Chasin, Adrian; Franco, Jacopo; Mitard, Jerome; Horiguchi, Naoto Journal: ECS transactions Issue: Volume 98:Number 5(2020) Page Start: 377 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. (Invited) Sub-40mV Sigma VTH Igzo nFETs in 300mm Fab. (8th September 2020) Authors: Mitard, Jerome; Kljucar, Luka; Rassoul, Nouredine; Dekkers, Harold F. W.; van Setten, Michiel; Chasin, Adrian; Pourtois, Geoffrey; Belmonte, Attilio; Delhougne, Romain; Donadio, Gabriele Luca; Goux, Ludovic; Nag, Manoj; Wilson, Chris; Tokei, Zsolt; Borniquel, Jose Ignacio del agua; Steudel, Soere... Journal: ECS transactions Issue: Volume 98:Number 7(2020) Page Start: 205 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. (Invited) The Assessment of Border Traps in High-Mobility Channel Materials. (8th September 2015) Authors: Simoen, Eddy; Alian, AliReza; Arimura, Hiroaki; Lin, D; Mertens, Hans; Mitard, Jerome; Sioncke, Sonia; Fang, Wen; Luo, Jun; Zhao, Chao; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Claeys, Cor Journal: ECS transactions Issue: Volume 69:Number 5(2015) Page Start: 205 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. 11‐2: Technology Developments in High‐Resolution FMM‐free OLED and BEOL IGZO TFTs for Power‐Efficient Microdisplays. Issue 1 (28th June 2021) Authors: Ke, Tung-Huei; Glushkova, Anastasia; Sandeheng, Calvin Mona; Alvarez, Gema Molina; Vandenplas, Erwin; Ciarnain, Rossa Mac; Malinowski, Pawel E.; Mitard, Jerome; Rassoul, Nouredine; Belmonte, Attilio; Tokei, Zsolt; Kar, Gouri Sankar; Genoe, Jan; Heremans, Paul Journal: Digest of technical papers Issue: Volume 52:Issue 1(2021) Page Start: 127 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm. (20th December 2022) Authors: Choi, Seoyeon; Park, Dong Geun; Kim, Min Jung; Bang, Seain; Kim, Jungchun; Jin, Seunghee; Huh, Ki Seok; Kim, Donghyun; Mitard, Jerome; Han, Cheol E.; Lee, Jae Woo Journal: Advanced intelligent systems Issue: Volume 5:Number 1(2023) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗