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2. Correction: Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction. Issue 13 (23rd March 2022)

3. Electron microscopy imaging of proteins on gallium phosphide semiconductor nanowires. Issue 7 (3rd February 2016)

4. Measurement of strain in InGaN/GaN nanowires and nanopyramids. (1st April 2015)

5. NanoMAX: the hard X‐ray nanoprobe beamline at the MAX IV Laboratory. (5th October 2021)

6. Phase control of attosecond pulses in a train. (16th January 2018)

8. Secondary electron imaging of nanostructures using Extreme Ultra‐Violet attosecond pulse trains and Infra‐Red femtosecond pulses. Issue 1 (3rd January 2013)

9. Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction. Issue 27 (12th June 2020)