Correction: Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction. Issue 13 (23rd March 2022)
- Record Type:
- Journal Article
- Title:
- Correction: Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction. Issue 13 (23rd March 2022)
- Main Title:
- Correction: Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction
- Authors:
- Dzhigaev, Dmitry
Svensson, Johannes
Krishnaraja, Abinaya
Zhu, Zhongyunshen
Ren, Zhe
Liu, Yi
Kalbfleisch, Sebastian
Björling, Alexander
Lenrick, Filip
Balogh, Zoltan Imre
Hammarberg, Susanna
Wallentin, Jesper
Timm, Rainer
Wernersson, Lars-Erik
Mikkelsen, Anders - Abstract:
- Abstract : Correction for 'Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction' by Dmitry Dzhigaev et al., Nanoscale, 2020, 12, 14487–14493, DOI: ; 10.1039/D0NR02260H .
- Is Part Of:
- Nanoscale. Volume 14:Issue 13(2022)
- Journal:
- Nanoscale
- Issue:
- Volume 14:Issue 13(2022)
- Issue Display:
- Volume 14, Issue 13 (2022)
- Year:
- 2022
- Volume:
- 14
- Issue:
- 13
- Issue Sort Value:
- 2022-0014-0013-0000
- Page Start:
- 5247
- Page End:
- 5247
- Publication Date:
- 2022-03-23
- Subjects:
- Nanoscience -- Periodicals
Nanotechnology -- Periodicals
620.505 - Journal URLs:
- http://www.rsc.org/Publishing/Journals/NR/Index.asp ↗
http://www.rsc.org/ ↗ - DOI:
- 10.1039/d2nr90060b ↗
- Languages:
- English
- ISSNs:
- 2040-3364
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 9830.266000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 21144.xml