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You searched for: Author/Creator Martin-Martinez, J.- Martin-Martinez, J. [remove] 9
- 621.38152 9
- Semiconducteurs -- Périodiques 9
- Semiconductors -- Periodicals 9
- Aging -- Degradation -- CMOS inverter -- BTI -- Hot-carrier injection -- Off-state stress -- Device-circuit aging correlations 1
- Aging -- FD-SOI -- BTI -- HCI -- OFF-State -- Stress -- NW-FETs -- Reliability 1
- Aging -- FD-SOI -- BTI -- HCI OFF-State -- Stress -- NW-FETs -- Reliability 1
- Automatic measurement setup -- Conductivity control -- Massive characterization -- Modelling -- Neuromorphic engineering -- RRAM -- Synaptic devices 1
- CMOS -- BTI -- RTN -- Defects -- Modelling -- Characterization -- Reliability 1
- CMOS technology -- 'On-the-fly' stress characterization -- Circuit performance degradation -- Transistor aging -- CMOS inverters -- Measurement technique -- Analytical modelling 1
- Conductive filaments -- Neuromorphic applications -- Parameter extraction -- Physical model -- Resistive switching memory -- RRAM 1