1. A statistical study into reliability of FPGA implemented circuits: Simulation and modelling. (February 2021) Authors: Aguirre-Morales, J.D.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 117(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Design and implementation of a low cost test bench to assess the reliability of FPGA. Issue 9 (August 2015) Authors: Naouss, M.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1341 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA. (November 2022) Authors: Sobas, J.; Airimitoaie, T.-B.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. FPGA LUT delay degradation due to HCI: Experiment and simulation results. (September 2016) Authors: Naouss, M.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. FPGA LUT delay degradation due to HCI: Experiment and simulation results. (September 2016) Authors: Naouss, M.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Simulation and modelling of long term reliability of digital circuits implemented in FPGA. (September 2018) Authors: Aguirre Morales, J.D.; Marc, F.; Bensoussan, A.; Durier, A. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 1130 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗