1. 3035 Vascular Disrupting Agent ASA 404 evaluated in human isolated ventilated and perfused lung lobes containing NSCLC. (September 2015) Authors: Hohenberger, P.; Elleni, S.; Marc, F.; Eva, R.; Peter, F.; Alexander, M.; Benito, Y.; Nowak, K. Journal: European journal of cancer Issue: Volume 51:(2015)Supplement 3 Page Start: S608 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions. (January 2020) Authors: Mukherjee, C.; Marc, F.; Couret, M.; Fischer, G.G.; Jaoul, M.; Céli, D.; Aufinger, K.; Zimmer, T.; Maneux, C. Journal: Solid-state electronics Issue: Volume 163(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A statistical study into reliability of FPGA implemented circuits: Simulation and modelling. (February 2021) Authors: Aguirre-Morales, J.D.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 117(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A unified aging compact model for hot carrier degradation under mixed-mode and reverse E-B stress in complementary SiGe HBTs. (October 2020) Authors: Mukherjee, C.; Fischer, G.G.; Marc, F.; Couret, M.; Zimmer, T.; Maneux, C. Journal: Solid-state electronics Issue: Volume 172(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Archaeal histones: structures, stability and DNA binding. (1st April 2004) Authors: Reeve, J.N.; Bailey, K.A.; Li, W-t.; Marc, F.; Sandman, K.; Soares, D.J. Journal: Biochemical Society transactions Issue: Volume 32:Number 2(2004) Page Start: 227 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Design and implementation of a low cost test bench to assess the reliability of FPGA. Issue 9 (August 2015) Authors: Naouss, M.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1341 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA. (November 2022) Authors: Sobas, J.; Airimitoaie, T.-B.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. FPGA LUT delay degradation due to HCI: Experiment and simulation results. (September 2016) Authors: Naouss, M.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. FPGA LUT delay degradation due to HCI: Experiment and simulation results. (September 2016) Authors: Naouss, M.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Simulation and modelling of long term reliability of digital circuits implemented in FPGA. (September 2018) Authors: Aguirre Morales, J.D.; Marc, F.; Bensoussan, A.; Durier, A. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 1130 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗