1. 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM. (August 2020) Authors: Van Aert, Sandra; De Backer, Annick; De wael, Annelies; Fatermans, Jarmo; Friedrich, Thomas; Lobato, Ivan; O'Leary, Colum; Varambhia, Aakash; Altantzis, Thomas; Jones, Lewys; Dekker, Arjan den; Nellist, Peter; Bals, Sara Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2606 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography. (27th October 2017) Authors: Sentosun, Kadir; Lobato, Ivan; Bladt, Eva; Zhang, Yang; Palenstijn, Willem Jan; Batenburg, Kees Joost; Van Dyck, Dirk; Bals, Sara Journal: Particle and particle systems characterization Issue: Volume 34:Number 12(2017:Dec.) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Combining ADF-EDX scattering cross-sections for elemental quantification of nanostructures. (August 2021) Authors: Zhang, Zezhong; Backer, Annick De; Lobato, Ivan; Aert, Sandra Van; Nellist, Peter Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 600 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Direct Imaging of ALD Deposited Pt Nanoclusters inside the Giant Pores of MIL‐101. (19th February 2016) Authors: Meledina, Maria; Turner, Stuart; Filippousi, Maria; Leus, Karen; Lobato, Ivan; Ramachandran, Ranjith K.; Dendooven, Jolien; Detavernier, Christophe; Van Der Voort, Pascal; Van Tendeloo, Gustaaf Journal: Particle and particle systems characterization Issue: Volume 33:Number 7(2016:Jul.) Page Start: 382 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Do you believe that atoms stay in place when you observe them in HREM?. (January 2015) Authors: Van Dyck, Dirk; Lobato, Ivan; Chen, Fu-Rong; Kisielowski, Christian Journal: Micron Issue: Volume 68(2015:Jan.) Page Start: 158 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Do you believe that atoms stay in place when you observe them in HREM?. (January 2015) Authors: Van Dyck, Dirk; Lobato, Ivan; Chen, Fu-Rong; Kisielowski, Christian Journal: Micron Issue: Volume 68(2015:Jan.) Page Start: 158 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Epitaxial Stress‐Free Growth of High Crystallinity Ferroelectric PbZr0.52Ti0.48O3 on GaN/AlGaN/Si(111) Substrate. Issue 2 (27th November 2017) Authors: Li, Lin; Liao, Zhaoliang; Gauquelin, Nicolas; Nguyen, Minh Duc; Hueting, Raymond J. E.; Gravesteijn, Dirk J.; Lobato, Ivan; Houwman, Evert P.; Lazar, Sorin; Verbeeck, Johan; Koster, Gertjan; Rijnders, Guus Journal: Advanced materials interfaces Issue: Volume 5:Issue 2(2018) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Optimized loss function in deep learning profilometry for improved prediction performance. (16th April 2021) Authors: Van Der Jeught, Sam; Muyshondt, Pieter G G; Lobato, Ivan Journal: JPhys photonics Issue: Volume 3:Number 2(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Probing Graphene Defect Kinetics at Millisecond Time Resolution Using Direct Detection and Machine Learning. (August 2022) Authors: Huang, Chen; Allen, Christopher; Skowron, Stephen; Lobato, Ivan; Sasaki, Takeo; Van Aert, Sandra; Besley, Elena; Kirkland, Angus Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 1794 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image. (August 2019) Authors: De Backer, Annick; De wael, Annelies; Lobato, Ivan; Altantzis, Thomas; Béché, Armand; Jones, Lewys; Nellist, Peter D; Bals, Sara; Van Aert, Sandra Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1808 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗