Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography. (27th October 2017)

• Record Type: Journal Article
• Authors: Sentosun, Kadir; Lobato, Ivan; Bladt, Eva; Zhang, Yang; Palenstijn, Willem Jan; Batenburg, Kees Joost; Van Dyck, Dirk; Bals, Sara
• Is Part Of: Particle and particle systems characterization. Volume 34:Number 12(2017:Dec.)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2017-10-27
• Subjects: artifact reduction -- electron tomography -- sinogram interpolation; Particles -- Periodicals; 620.43
• DOI: 10.1002/ppsc.201700287
• Languages: English
• ISSNs: 0934-0866

Abstract

Abstract: Electron tomography is a well‐known technique providing a 3D characterization of the morphology and chemical composition of nanoparticles. However, several reasons hamper the acquisition of tilt series with a large number of projection images, which deteriorate the quality of the 3D reconstruction. Here, an inpainting method that is based on sinogram interpolation is proposed, which enables one to reduce artifacts in the reconstruction related to a limited tilt series of projection images. The advantages of the approach will be demonstrated for the 3D characterization of nanoparticles using phantoms and several case studies. Abstract : 3D characterization of beam sensitive nanomaterials using electron tomography requires dedicated reconstruction algorithms. Since undersampling of the nanoparticles leads to artifacts in the 3D reconstruction, here an artifact reduction method based on sinogram interpolation is described. The methodology is explained using phantom objects and the benefits of the method are presented using experimental datasets in both qualitative and quantitative manner.