1. A dynamically reconfigurable entropy source circuit for high-throughput true random number generator. (March 2023) Authors: Jin, Liyu; Yi, Maoxiang; Xiao, Yuan; Sun, Lifa; Lu, Yingchun; Liang, Huaguo Journal: Microelectronics journal Issue: Volume 133(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A high reliability physically unclonable function based on multiple tunable ring oscillator. (November 2021) Authors: Zhang, Yuan; Liang, Huaguo; Yao, Liang; Yi, Maoxiang; Huang, Zhengfeng; Lu, Yingchun Journal: Microelectronics journal Issue: Volume 117(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A high-speed and triple-node-upset recovery latch with heterogeneous interconnection. (December 2021) Authors: Huang, Zhengfeng; Wang, Hao; Ang, Yang; Liang, Huaguo; Ouyang, Yiming; Ni, Tianming Journal: Microelectronics journal Issue: Volume 118(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A reconfigurable PUF structure with dual working modes based on entropy separation model. (June 2022) Authors: Wang, Yanjie; Liang, Huaguo; Wang, Yuchuan; Yao, Liang; Yi, Maoxiang; Huang, Zhengfeng; Lu, Yingchun Journal: Microelectronics journal Issue: Volume 124(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. A triple-node-upset self-recoverable design based on Schmitt-triggers and C-elements. (May 2023) Authors: Xu, Hui; Liu, Chaoming; Ma, Ruijun; Liang, Huaguo; Huang, Zhengfeng; Zhou, Jing; Zhu, Shuo Journal: Microelectronics and reliability Issue: Volume 144(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. (August 2016) Authors: Yan, Aibin; Liang, Huaguo; Huang, Zhengfeng; Jiang, Cuiyun; Ouyang, Yiming; Li, Xuejun Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 239 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. (August 2016) Authors: Yan, Aibin; Liang, Huaguo; Huang, Zhengfeng; Jiang, Cuiyun; Ouyang, Yiming; Li, Xuejun Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 239 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Architecting a priority-based dynamic media access control mechanism in Wireless Network-on-Chip. (October 2021) Authors: Ouyang, Yiming; Sun, Chenglong; Jia, Boyuan; Wang, Qi; Liang, Huaguo Journal: Microelectronics journal Issue: Volume 116(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Design of fully adaptive routing and hybrid VC allocation in wireless NOC. (February 2022) Authors: Ouyang, Yiming; Li, Ruifeng; Hu, Chunlei; Wang, Qi; Lu, Yingchun; Liang, Huaguo Journal: Microelectronics journal Issue: Volume 120(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Design of MNU-Resilient latches based on input-split C-elements. (October 2021) Authors: Huang, Zhengfeng; Li, Xiandong; Gong, Zhouyu; Liang, Huaguo; Lu, Yingchun; Ouyang, Yiming; Ni, Tianming Journal: Microelectronics journal Issue: Volume 116(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗