1. Biaxial Stress Evaluation in SiGe Epitaxially Grown on Ge Substrate by Oil-Immersion Raman Spectroscopy. (14th September 2015) Authors: Takeuchi, Kazuma; Kosemura, Daisuke; Yamamoto, Shotaro; Tomita, Motohiro; Usuda, Koji; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 69:Number 10(2015) Page Start: 81 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Electrical field analysis of metal‐surface plasmon resonance using a biaxially strained Si substrate. (14th April 2014) Authors: Kosemura, Daisuke; Che Mohd Yusoff, Siti Norhidayah binti; Ogura, Atsushi Journal: Journal of Raman spectroscopy Issue: Volume 45:Number 6(2014:Jun.) Page Start: 414 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Evaluation of Anisotropic Biaxial Stress in Si1-XGex/Ge Mesa-Structure by Oil-Immersion Raman Spectroscopy. (31st March 2015) Authors: Yamamoto, Shotaro; Takeuchi, Kazuma; Yokogawa, Ryo; Tomita, Motohiro; Kosemura, Daisuke; Usuda, Koji; Ogura, Atsushi Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 39 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Examination of phonon deformation potentials for accurate strain measurements in silicon–germanium alloys with the whole composition range by Raman spectroscopy. (22nd January 2016) Authors: Kosemura, Daisuke; Yamamoto, Shotaro; Takeuchi, Kazuma; Usuda, Koji; Ogura, Atsushi Journal: Japanese journal of applied physics Issue: Volume 55:Number 2(2016:Feb.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Oil-Immersion Raman Spectroscopy for c-Plane GaN on Si and Al2O3 Substrates. (13th April 2015) Authors: Imai, Ryosuke; Kosemura, Daisuke; Ogura, Atsushi Journal: ECS transactions Issue: Volume 66:Number 1(2015) Page Start: 119 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Probing spatial heterogeneity in silicon thin films by Raman spectroscopy. Issue 1 (December 2017) Authors: Yamazaki, Hideyuki; Koike, Mitsuo; Saitoh, Masumi; Tomita, Mitsuhiro; Yokogawa, Ryo; Sawamoto, Naomi; Tomita, Motohiro; Kosemura, Daisuke; Ogura, Atsushi Journal: Scientific reports Issue: Volume 7:Issue 1(2017) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Super-Resolution Raman Spectroscopy by Digital Image Processing. (18th February 2013) Authors: Tomita, Motohiro; Hashiguchi, Hiroki; Yamaguchi, Takuya; Takei, Munehisa; Kosemura, Daisuke; Ogura, Atsushi Other Names: Tsen Kong-Thon Academic Editor. Journal: Journal of spectroscopy Issue: Volume 2013(2013) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗