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You searched for: Author/Creator Kämpfe, Thomas

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1. A FeFET with a novel MFMFIS gate stack: towards energy-efficient and ultrafast NVMs for neuromorphic computing. (29th July 2021)

2. A Fully Integrated Ferroelectric Thin‐Film‐Transistor – Influence of Device Scaling on Threshold Voltage Compensation in Displays. (9th May 2021)

3. A Study on Imprint Behavior of Ferroelectric Hafnium Oxide Caused by High‐Temperature Annealing. Issue 7 (8th March 2023)

4. Back‐End‐of‐Line Compatible Low‐Temperature Furnace Anneal for Ferroelectric Hafnium Zirconium Oxide Formation. Issue 8 (26th February 2020)

5. Back‐End‐of‐Line Compatible Low‐Temperature Furnace Anneal for Ferroelectric Hafnium Zirconium Oxide Formation. Issue 8 (27th April 2020)

6. Fluorite‐Structured Ferroelectric and Antiferroelectric Materials: A Gateway of Miniaturized Electronic Devices. (1st August 2022)

7. Impact of Ferroelectric Layer Thickness on Reliability of Back‐End‐of‐Line‐Compatible Hafnium Zirconium Oxide Films. Issue 4 (6th October 2022)

10. On the Origin of Wake‐Up and Antiferroelectric‐Like Behavior in Ferroelectric Hafnium Oxide. Issue 5 (17th May 2021)