1. 57Fe polarization‐dependent synchrotron Mössbauer spectroscopy using a diamond phase plate and an iron borate nuclear Bragg monochromator. (13th February 2015) Authors: Mitsui, Takaya; Imai, Yasuhiko; Masuda, Ryo; Seto, Makoto; Mibu, Ko Journal: Journal of synchrotron radiation Issue: Volume 22:Part 2(2015) Page Start: 427 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 57Fe polarization‐dependent synchrotron Mössbauer spectroscopy using a diamond phase plate and an iron borate nuclear Bragg monochromator. (13th February 2015) Authors: Mitsui, Takaya; Imai, Yasuhiko; Masuda, Ryo; Seto, Makoto; Mibu, Ko Journal: Journal of synchrotron radiation Issue: Volume 22:Part 2(2015) Page Start: 427 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Analysis of inverse-piezoelectric-effect-induced lattice deformation in AlGaN/GaN high-electron-mobility transistors by time-resolved synchrotron radiation nanobeam X-ray diffraction. (2nd September 2021) Authors: Shiomi, Haruna; Ueda, Akira; Tohei, Tetsuya; Imai, Yasuhiko; Hamachi, Takeaki; Sumitani, Kazushi; Kimura, Shigeru; Ando, Yuji; Hashizume, Tamotsu; Sakai, Akira Journal: Applied physics express Issue: Volume 14:Number 9(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Analysis of Microscopic Strain and Crystalline Structure in Ge/Ge1−XSnx Fine Structures by Using Synchrotron X-ray Microdiffraction. (18th August 2016) Authors: Ike, Shinichi; Nakatsuka, Osamu; Inuzuka, Yuki; Washizu, Tomoya; Takeuchi, Wakana; Imai, Yasuhiko; Kimura, Shigeru; Zaima, Shigeaki Journal: ECS transactions Issue: Volume 75:Number 8(2016) Page Start: 769 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Crystalline property analysis of semipolar (20–21) GaN on (22–43) patterned sapphire substrate by X‐ray microdiffraction and transmission electron microscopy. Issue 5 (4th February 2015) Authors: Arauchi, Takuji; Takeuchi, Shotaro; Hashimoto, Yasuhiro; Nakamura, Yoshiaki; Yamane, Keisuke; Okada, Narihito; Imai, Yasuhiko; Kimura, Shigeru; Tadatomo, Kazuyuki; Sakai, Akira Journal: Physica status solidi Issue: Volume 252:Issue 5(2015:May) Page Start: 1149 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Depth-resolved analysis of lattice distortions in high-Ge-content SiGe/compositionally graded SiGe films using nanobeam x-ray diffraction. (25th October 2018) Authors: Shida, Kazuki; Takeuchi, Shotaro; Tohei, Tetsuya; Imai, Yasuhiko; Kimura, Shigeru; Schulze, Andreas; Caymax, Matty; Sakai, Akira Journal: Semiconductor science and technology Issue: Volume 33:Number 12(2018:Dec.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Effect of the film thickness on the crystal structure and ferroelectric properties of (Hf0.5Zr0.5)O2 thin films deposited on various substrates. (1st November 2017) Authors: Shiraishi, Takahisa; Katayama, Kiliha; Yokouchi, Tatsuhiko; Shimizu, Takao; Oikawa, Takahiro; Sakata, Osami; Uchida, Hiroshi; Imai, Yasuhiko; Kiguchi, Takanori; Konno, Toyohiko J.; Funakubo, Hiroshi Journal: Materials science in semiconductor processing Issue: Volume 70(2017) Page Start: 239 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Evaluation of Polishing-Induced Subsurface Damage of 4H-SiC (0001) by Cross-Sectional Electron Backscattered Diffraction and Synchrotron X-Ray Micro-Diffraction. Issue 55 (9th June 2016) Authors: Ashida, Koji; Dojima, Daichi; Kutsuma, Yasunori; Torimi, Satoshi; Nogami, Satoru; Imai, Yasuhiko; Kimura, Shigeru; Mizuki, Jun-ichiro; Ohtani, Noboru; Kaneko, Tadaaki Journal: MRS advances Issue: Volume 1:Issue 55(2016) Page Start: 3697 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Experimentally obtained and computer‐simulated X‐ray asymmetric eight‐beam pinhole topographs for a silicon crystal. Issue 3 (30th April 2019) Authors: Okitsu, Kouhei; Imai, Yasuhiko; Yoda, Yoshitaka; Ueji, Yoshinori Journal: Acta crystallographica Issue: Volume 75:Issue 3(2019:May) Page Start: 474 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Experimentally obtained and computer‐simulated X‐ray non‐coplanar 18‐beam pinhole topographs for a silicon crystal. Issue 3 (30th April 2019) Authors: Okitsu, Kouhei; Imai, Yasuhiko; Yoda, Yoshitaka Journal: Acta crystallographica Issue: Volume 75:Issue 3(2019:May) Page Start: 483 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗