Experimentally obtained and computer‐simulated X‐ray non‐coplanar 18‐beam pinhole topographs for a silicon crystal. Issue 3 (30th April 2019)

• Record Type: Journal Article
• Authors: Okitsu, Kouhei; Imai, Yasuhiko; Yoda, Yoshitaka
• Is Part Of: Acta crystallographica. Volume 75:Issue 3(2019:May)
• Page Start: 483
• Page End: 488
• Publication Date: 2019-04-30
• Subjects: X‐ray diffraction -- dynamical theory -- multiple reflection -- n‐beam reflection -- phase problem -- protein crystallography; Crystallography -- Periodicals; Condensed matter -- Periodicals; 548
• DOI: 10.1107/S2053273319002936
• Languages: English
• ISSNs: 2053-2733

Abstract

Abstract : Experimentally obtained non‐coplanar 18‐beam pinhole topographs were compared with computer simulations based on the Ewald–Laue theory. Abstract : Non‐coplanar 18‐beam X‐ray pinhole topographs for a silicon crystal were computer simulated by fast Fourier transforming the X‐ray rocking amplitudes that were obtained by solving the n ‐beam ( n = 18) Ewald–Laue dynamical theory (E‐L&FFT method). They were in good agreement with the experimentally obtained images captured using synchrotron X‐rays. From this result and further consideration based on it, it has been clarified that the X‐ray diffraction intensities when n X‐ray waves are simultaneously strong in the crystal can be computed for any n by using the E‐L&FFT method.