1. Analysis of the Forbush Decreases and Ground‐Level Enhancement on September 2017 Using Neutron Spectrometers Operated in Antarctic and Midlatitude Stations. Issue 1 (24th January 2019) Authors: Hubert, G.; Pazianotto, M. T.; Federico, C. A.; Ricaud, P. Journal: Journal of geophysical research Issue: Volume 124:Issue 1(2019) Page Start: 661 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Circuit design using Schmitt Trigger to reliability improvement. (November 2020) Authors: Zimpeck, A.L.; Meinhardt, C.; Artola, L.; Hubert, G.; Kastensmidt, F.L.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Cosmic ray solar modulation and Forbush decrease analyses based on atmospheric neutron spectrometry at mountain altitude and GEANT4 simulations of extensive air showers. Issue 12 (3rd December 2013) Authors: Cheminet, A.; Hubert, G.; Lacoste, V.; Maurin, D.; Derome, L. Journal: Journal of geophysical research Issue: Volume 118:Issue 12(2013:Dec.) Page Start: 7488 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. (September 2017) Authors: de Aguiar, Y.Q.; Artola, L.; Hubert, G.; Meinhardt, C.; Kastensmidt, F.L.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 660 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. (September 2017) Authors: Rousselin, T.; Hubert, G.; Régis, D.; Gatti, M.; Bensoussan, A. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 159 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Impact of different transistor arrangements on gate variability. (September 2018) Authors: Zimpeck, A.L.; Meinhardt, C.; Artola, L.; Hubert, G.; Kastensmidt, F.L.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Mitigation of process variability effects using decoupling cells. (September 2019) Authors: Zimpeck, A.L.; Meinhardt, C.; Artola, L.; Hubert, G.; Kastensmidt, F.L.; Reis, R.A.L. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Modeling of ground albedo neutrons to investigate seasonal cosmic ray‐induced neutron variations measured at high‐altitude stations. Issue 12 (27th December 2016) Authors: Hubert, G.; Pazianotto, M. T.; Federico, C. A. Journal: Journal of geophysical research Issue: Volume 121:Issue 12(2016:Dec.) Page Start: 12, 186 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Neutron monitors and muon detectors for solar modulation studies: 2. ϕ time series. Issue 4 (15th August 2017) Authors: Ghelfi, A.; Maurin, D.; Cheminet, A.; Derome, L.; Hubert, G.; Melot, F. Journal: Advances in space research Issue: Volume 60:Issue 4(2017) Page Start: 833 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Neutron monitors and muon detectors for solar modulation studies: Interstellar flux, yield function, and assessment of critical parameters in count rate calculations. Issue 1 (1st January 2015) Authors: Maurin, D.; Cheminet, A.; Derome, L.; Ghelfi, A.; Hubert, G. Journal: Advances in space research Issue: Volume 55:Issue 1(2015) Page Start: 363 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗