1. 3D observation of chromosome scaffold structure using a 360° electron tomography sample holder. (November 2019) Authors: Phengchat, Rinyaporn; Hayashida, Misa; Ohmido, Nobuko; Homeniuk, Darren; Fukui, Kiichi Journal: Micron Issue: Volume 126(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film. (September 2017) Authors: Malac, Marek; Hettler, Simon; Hayashida, Misa; Kawasaki, Masahiro; Konyuba, Yuji; Okura, Yoshi; Iijima, Hirofumi; Ishikawa, Isamu; Beleggia, Marco Journal: Micron Issue: Volume 100(2017) Page Start: 10 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electron Diffraction Based Tilt Angle Measurements in Electron Tomography. (August 2014) Authors: Hayashida, Misa; Malac, Marek; Bergen, Mike; Li, Peng; Egerton, Ray Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 806 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Electron Diffraction Based Tilt Angle Measurements in Electron Tomography. (August 2014) Authors: Hayashida, Misa; Malac, Marek; Bergen, Mike; Li, Peng; Egerton, Ray Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 806 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Evaluation of electron tomography reconstruction methods for interface roughness measurement. Issue 5 (21st February 2018) Authors: Hayashida, Misa; Ogawa, Shinichi; Malac, Marek Other Names: Verkade Paul specialEditor. Journal: Microscopy research and technique Issue: Volume 81:Issue 5(2018) Page Start: 515 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. High-accuracy electron tomography of semiconductor devices. (23rd September 2015) Authors: Hayashida, Misa; Gunawan, Lina; Malac, Marek; Pawlowicz, Chris; Couillard, Martin Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1609 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. High-accuracy electron tomography of semiconductor devices. (August 2015) Authors: Hayashida, Misa; Gunawan, Lina; Malac, Marek; Pawlowicz, Chris; Couillard, Martin Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1609 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. High-Energy Electron Scattering in Thick Samples Evaluated by Bright-Field Transmission Electron Microscopy, Energy-Filtering Transmission Electron Microscopy, and Electron Tomography. (June 2022) Authors: Hayashida, Misa; Malac, Marek Journal: Microscopy and microanalysis Issue: Volume 28:Number 3(2022) Page Start: 659 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Higher-order structure of barley chromosomes observed by electron tomography. (September 2022) Authors: Hayashida, Misa; Sartsanga, Channarong; Phengchat, Rinyaporn; Malac, Marek; Harada, Ken; Akashi, Tetsuya; Fukui, Kiichi; Ohmido, Nobuko Journal: Micron Issue: Volume 160(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Higher-Order Structure of Human Chromosomes Observed by Electron Diffraction and Electron Tomography. (February 2021) Authors: Hayashida, Misa; Phengchat, Rinyaporn; Malac, Marek; Harada, Ken; Akashi, Tetsuya; Ohmido, Nobuko; Fukui, Kiichi Journal: Microscopy and microanalysis Issue: Volume 27:Number 1(2021) Page Start: 149 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗