1. Boosted UV Photodetection Performance in Chemically Etched Amorphous Ga2O3 Thin‐Film Transistors. Issue 8 (24th February 2020) Authors: Han, Zuyin; Liang, Huili; Huo, Wenxing; Zhu, Xiaoshan; Du, Xiaolong; Mei, Zengxia Journal: Advanced optical materials Issue: Volume 8:Issue 8(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Dual-active-layer InGaZnO high-voltage thin-film transistors. (26th May 2021) Authors: Huo, Wenxing; Liang, Huili; Lu, Yicheng; Han, Zuyin; Zhu, Rui; Sui, Yanxin; Wang, Tao; Mei, Zengxia Journal: Semiconductor science and technology Issue: Volume 36:Number 6(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Integrated Flexible Ga2O3 Deep UV Photodetectors Powered by Environmental Electromagnetic Radiation Energy. Issue 3 (8th February 2021) Authors: Wang, Tao; Liang, Huili; Han, Zuyin; Sui, Yanxin; Mei, Zengxia Journal: Advanced materials technologies Issue: Volume 6:Issue 3(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Recent Progress of Deep Ultraviolet Photodetectors using Amorphous Gallium Oxide Thin Films. Issue 1 (14th October 2020) Authors: Liang, Huili; Han, Zuyin; Mei, Zengxia Other Names: Kuznetsov Andrej guestEditor.; Dangtip Somsak guestEditor.; Intarasiri Saweat guestEditor. Journal: Physica status solidi Issue: Volume 218:Issue 1(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Reliability/Uniformity improvement induced by an ultrathin TiO2 insertion in Ti/HfO2/Pt resistive switching memories. (August 2016) Authors: Jiang, Ran; Han, Zuyin; Du, Xianghao Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 37 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Reliability/Uniformity improvement induced by an ultrathin TiO2 insertion in Ti/HfO2/Pt resistive switching memories. (August 2016) Authors: Jiang, Ran; Han, Zuyin; Du, Xianghao Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 37 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗