Search

Search Constraints

You searched for: Author/Creator Gutsch, Sebastian

Search Results

1. Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide — ERRATUM. (17th October 2016)

2. Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide. (14th September 2016)

5. Dielectrophoretic investigation of Bi2Te3 nanowires—a microfabricated thermoelectric characterization platform for measuring the thermoelectric and structural properties of single nanowires. (6th March 2015)

6. Effect of Si3N4‐Mediated Inversion Layer on the Electroluminescence Properties of Silicon Nanocrystal Superlattices. (22nd March 2018)

7. Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations. (4th March 2019)

8. Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations. (June 2019)