Atom probe tomography of size‐controlled phosphorus doped silicon nanocrystals. Issue 1 (29th November 2016)
- Record Type:
- Journal Article
- Title:
- Atom probe tomography of size‐controlled phosphorus doped silicon nanocrystals. Issue 1 (29th November 2016)
- Main Title:
- Atom probe tomography of size‐controlled phosphorus doped silicon nanocrystals
- Authors:
- Nomoto, Keita
Hiller, Daniel
Gutsch, Sebastian
Ceguerra, Anna V.
Breen, Andrew
Zacharias, Margit
Conibeer, Gavin
Perez‐Wurfl, Ivan
Ringer, Simon P. - Abstract:
- Abstract : Doping of silicon nanocrystals is essential to control their electronic and optical properties. The incorporation of an impurity into a silicon nanovolume is a nontrivial task due to the self‐purification effect. Here, a systematic atom probe tomography study of the phosphorus distribution and incorporation in size‐controlled silicon nanocrystals embedded in silicon dioxide is presented. Qualitatively, it turns out that the phosphorus distribution in the system follows a universal, nanocrystal‐size independent trend: phosphorus‐enrichment at the interface with a substantial phosphorus‐incorporation in the silicon nanocrystal as small as 2 nm in diameter. This clearly contradicts strict self‐purification. These observations are explained by the bulk‐solubility and ‐segregation behaviour, kinetic effects related to the diffusion lengths, and nanoscale interface strain. The quantitative determination of the amount of phosphorus atoms per quantum dot enables a systematic understanding of phosphorus‐induced effects on optical and electronic properties of silicon nanovolumes. Abstract : In this study, a systematic atom probe tomography analysis of the phosphorus distribution and incorporation in size‐controlled silicon nanocrystals embedded in silicon dioxide is presented. The quantitative determination of the amount of P‐atoms ffects on the optical and electronic properties of Si nanoper quantum dot enables a systematic understanding of P‐induced evolumes.
- Is Part Of:
- Physica status solidi. Volume 11:Issue 1(2017)
- Journal:
- Physica status solidi
- Issue:
- Volume 11:Issue 1(2017)
- Issue Display:
- Volume 11, Issue 1 (2017)
- Year:
- 2017
- Volume:
- 11
- Issue:
- 1
- Issue Sort Value:
- 2017-0011-0001-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2016-11-29
- Subjects:
- atom probe tomography -- silicon -- nanocrystals -- phosphorus -- size
Solid state physics -- Periodicals
530.4105 - Journal URLs:
- http://www3.interscience.wiley.com/cgi-bin/jhome/112716025 ↗
http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1862-6270 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/pssr.201600376 ↗
- Languages:
- English
- ISSNs:
- 1862-6254
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 6475.235500
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 8585.xml