Author/Creator: De Sio, C. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator De Sio, C.

1. A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS. (November 2022)

Authors:: Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.
Journal:: Microelectronics and reliability
Issue:: Volume 138(2022)
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Record Type:: Journal Article
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2. Analysis of radiation-induced transient errors on 7 nm FinFET technology. (November 2021)

Authors:: Azimi, S.; De Sio, C.; Sterpone, L.
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
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Record Type:: Journal Article
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3. Complex field verification using a large area CMOS MAPS upstream in radiotherapy. (1st August 2022)

Authors:: Pritchard, J.L.; Velthuis, J.J.; Beck, L.; Li, Y.; De Sio, C.; Ballisat, L.; Duan, J.; Shi, Y.; Hugtenburg, R.P.
Journal:: Journal of instrumentation
Issue:: Volume 17:Number 8(2022)
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Record Type:: Journal Article
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4. Development of muon scattering tomography for detection of reinforcement in concrete. (1st September 2022)

Authors:: Dobrowolska, M.; Velthuis, J.J.; De Sio, C.; Kopp, A.; Milne, R.; Pearson, P.
Journal:: Journal of instrumentation
Issue:: Volume 17:Number 9(2022)
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Record Type:: Journal Article
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5. On the analysis of radiation-induced failures in the AXI interconnect module. (November 2020)

Authors:: De Sio, C.; Azimi, S.; Sterpone, L.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
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Record Type:: Journal Article
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6. Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs. (September 2019)

Authors:: De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
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Record Type:: Journal Article
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7. Towards 2D dosimetry using monolithic active pixel sensors and a copper grating. (1st December 2022)

Authors:: Beck, L.; Velthuis, J.J.; De Sio, C.; Pritchard, J.L.; Li, Y.; Hugtenburg, R.P.
Journal:: Journal of instrumentation
Issue:: Volume 17:Number 12(2022)
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Record Type:: Journal Article
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