21. Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures. (September 2016) Authors: Oliveira, Alberto Vinicius de; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor; Collaert, Nadine; Thean, Aaron Journal: Solid-state electronics Issue: Volume 123(2016) Page Start: 124 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
22. Defect engineering for shallow n‐type junctions in germanium: Facts and fiction. Issue 11 (18th July 2016) Authors: Simoen, Eddy; Schaekers, Marc; Liu, Jinbiao; Luo, Jun; Zhao, Chao; Barla, Kathy; Collaert, Nadine Journal: Physica status solidi Issue: Volume 213:Issue 11(2016:Nov.) Page Start: 2799 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
23. Effect of La doping on interface barrier between Si‐passivated Ge and insulating HfO2. Issue 10 (15th September 2016) Authors: Kolomiiets, Nadiia M.; Afanas'ev, Valery V.; Madia, Oreste; Cott, Daire J.; Collaert, Nadine; Thean, Aaron; Stesmans, Andre Journal: Physica status solidi Issue: Volume 13:Issue 10-12(2016) Page Start: 855 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
24. High mobility materials for CMOS applications. (2018) Editors: Collaert, Nadine Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
25. Impact of gate current on the operational transconductance amplifier designed with nanowire TFETs. (December 2021) Authors: de M. Nogueira, Alexandro; G.D. Agopian, Paula; Simoen, Eddy; Rooyackers, Rita; Claeys, Cor; Collaert, Nadine; Martino, Joao A. Journal: Solid-state electronics Issue: Volume 186(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
26. Impact of Gate Dielectric Material on Basic Parameters of MO(I)SHEMT Devices. (24th April 2020) Authors: Agopian, Paula Ghedini Der; Carmo, Genilson Julião do; Martino, Joao Antonio; Simoen, Eddy; Collaert, Nadine Journal: ECS transactions Issue: Volume 97:Number 5(2020) Page Start: 53 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
27. Impact of Gate Stack Dielectric on Intrinsic Voltage Gain and Low Frequency Noise in Ge pMOSFETs. (27th March 2015) Authors: Oliveira, Alberto Vinícius de; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Fang, Wen; Arimura, Hiroaki; Mitard, Jerome; Mertens, Hans; Simoen, Eddy; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Claeys, Cor Journal: ECS transactions Issue: Volume 66:Number 5(2015) Page Start: 309 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
28. Influence of Doping and Tunneling Interface Stoichiometry on n+In0.5Ga0.5As/p+GaAs0.5Sb0.5 Esaki Diode Behavior. (25th April 2016) Authors: El Kazzi, Salim; Alireza, A; Bordallo, Caio Cesar Mendes; Smets, Quentin; Desplanque, Ludovic; Wallart, Xavier; Richard, Olivier; Douhard, Bastien; Verhulst, Anne; Collaert, Nadine; Merckling, Clement; Heyns, Marc; Thean, Aaron Journal: ECS transactions Issue: Volume 72:Number 3(2016) Page Start: 73 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
29. Non-destructive characterization of extended crystalline defects in confined semiconductor device structures. Issue 15 (4th April 2018) Authors: Schulze, Andreas; Strakos, Libor; Vystavel, Tomas; Loo, Roger; Pacco, Antoine; Collaert, Nadine; Vandervorst, Wilfried; Caymax, Matty Journal: Nanoscale Issue: Volume 10:Issue 15(2018) Page Start: 7058 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
30. Observation of the Stacking Faults in In0.53Ga0.47As by Electron Channeling Contrast Imaging. Issue 17 (19th July 2019) Authors: Hsu, Po-Chun (Brent); Han, Han; Simoen, Eddy; Merckling, Clement; Eneman, Geert; Mols, Yves; Collaert, Nadine; Heyns, Marc Other Names: Kissinger Gudrun guestEditor.; Kot Dawid guestEditor.; Richter Hans guestEditor.; Zöllner Marvin guestEditor. Journal: Physica status solidi Issue: Volume 216:Issue 17(2019) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗