1. 3D microstructure analysis of silicon–boron phosphide mixed nanocrystals. Issue 13 (20th March 2020) Authors: Nomoto, Keita; Sugimoto, Hiroshi; Ceguerra, Anna V.; Fujii, Minoru; Ringer, Simon P. Journal: Nanoscale Issue: Volume 12:Issue 13(2020) Page Start: 7256 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A nexus between 3D atomistic data hybrids derived from atom probe microscopy and computational materials science: A new analysis of solute clustering in Al-alloys. (1st April 2017) Authors: Gault, Baptiste; Cui, Xiang Yuan; Moody, Michael P.; Ceguerra, Anna V.; Breen, Andrew J.; Marceau, Ross K.W.; Ringer, Simon P. Journal: Scripta materialia Issue: Number 131(2017) Page Start: 93 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Assessing the Spatial Accuracy of the Reconstruction in Atom Probe Tomography and a New Calibratable Adaptive Reconstruction. (April 2019) Authors: Ceguerra, Anna V.; Day, Alec C.; Ringer, Simon P. Editors: Thuvander, Mattias; Meisenkothen, Frederick; Sha, Gang Journal: Microscopy and microanalysis Issue: Volume 25:Number 2(2019) Page Start: 309 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Atom Probe Analysis of a Zr-based Bulk Metallic Glass. (August 2022) Authors: Bilal, Huma; Nomoto, Keita; Gludovatz, Bernd; Kruzic, Jamie J.; Ceguerra, Anna V.; Ringer, Simon P. Journal: Microscopy and microanalysis Issue: Volume 28:Number 4(2022) Page Start: 1348 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide — ERRATUM. (17th October 2016) Authors: Nomoto, Keita; Gutsch, Sebastian; Ceguerra, Anna V.; Breen, Andrew; Sugimoto, Hiroshi; Fujii, Minoru; Perez-Wurfl, Ivan; Ringer, Simon P.; Conibeer, Gavin Journal: MRS communications Issue: Volume 6:Number 4(2016:Dec.) Page Start: 469 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide. (14th September 2016) Authors: Nomoto, Keita; Gutsch, Sebastian; Ceguerra, Anna V.; Breen, Andrew; Sugimoto, Hiroshi; Fujii, Minoru; Perez-Wurfl, Ivan; Ringer, Simon P.; Conibeer, Gavin Journal: MRS communications Issue: Volume 6:Number 3(2016:Sep.) Page Start: 283 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Atom probe tomography of size‐controlled phosphorus doped silicon nanocrystals. Issue 1 (29th November 2016) Authors: Nomoto, Keita; Hiller, Daniel; Gutsch, Sebastian; Ceguerra, Anna V.; Breen, Andrew; Zacharias, Margit; Conibeer, Gavin; Perez‐Wurfl, Ivan; Ringer, Simon P. Journal: Physica status solidi Issue: Volume 11:Issue 1(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Community-Driven Methods for Open and Reproducible Software Tools for Analyzing Datasets from Atom Probe Microscopy. (August 2022) Authors: Kühbach, Markus; London, Andrew J.; Wang, Jing; Schreiber, Daniel K.; Mendez Martin, Francisca; Ghamarian, Iman; Bilal, Huma; Ceguerra, Anna V. Journal: Microscopy and microanalysis Issue: Volume 28:Number 4(2022) Page Start: 1038 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Distribution of boron and phosphorus and roles of co-doping in colloidal silicon nanocrystals. (1st October 2019) Authors: Nomoto, Keita; Sugimoto, Hiroshi; Cui, Xiang-Yuan; Ceguerra, Anna V.; Fujii, Minoru; Ringer, Simon P. Journal: Acta materialia Issue: Volume 178(2019) Page Start: 186 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale Tomography. (February 2021) Authors: Ceguerra, Anna V.; Breen, Andrew J.; Cairney, Julie M.; Ringer, Simon P.; Gorman, Brian P. Journal: Microscopy and microanalysis Issue: Volume 27:Number 1(2021) Page Start: 140 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗