1. (Invited) Atomically Controlled Processing for Si and Ge CVD Epitaxial Growth. (26th April 2016) Authors: Murota, Junichi; Yamamoto, Yuji; Costina, Ioan; Tillack, Bernd; Le Thanh, Vinh; Loo, Roger; Caymax, Matty Journal: ECS transactions Issue: Volume 72:Number 2(2016) Page Start: 71 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Heterogeneous Nano- to Wide-Scale Co-Integration of Beyond-Si and Si CMOS Devices to Enhance Future Electronics. (31st March 2015) Authors: Thean, Aaron; Collaert, Nadine; Radu, Iuliana P.; Waldron, Niamh; Merckling, Clement; Witters, Liesbeth; Loo, Roger; Mitard, Jerome; Rooyackers, Rita; Vandooren, Anne; Verhulst, A.; Veloso, Anabela; Yakimets, D.; Bao, T. Huynh; Chiappe, Danielle; Vaysset, A.; Zografos, O.; Caymax, Matty; Huygheba... Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 3 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) On the Electrical Activity of Extended Defects in High-Mobility Channel Materials. (14th September 2015) Authors: Simoen, Eddy; Eneman, Geert; Hikavyy, Andriy Yakovitch; Loo, Roger; Gupta, Somya; Merckling, Clement; Alian, AliReza; Schulze, Andreas; Caymax, Matty; Langer, Robert; Barla, Kathy; Claeys, Cor Journal: ECS transactions Issue: Volume 69:Number 10(2015) Page Start: 119 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A chemisorbed interfacial layer for seeding atomic layer deposition on graphite. Issue 28 (13th July 2021) Authors: Brown, Anton; Greenwood, John; Lockhart de la Rosa, César J.; Rodríguez González, Miriam C.; Verguts, Ken; Brems, Steven; Zhang, Haodong; Hirsch, Brandon E.; De Gendt, Stefan; Delabie, Annelies; Caymax, Matty; Teyssandier, Joan; De Feyter, Steven Journal: Nanoscale Issue: Volume 13:Issue 28(2021) Page Start: 12327 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. A deep‐level transient spectroscopy study of p‐type silicon Schottky barriers containing a Si–O superlattice. Issue 4 (7th October 2016) Authors: Simoen, Eddy; Jayachandran, Suseendran; Delabie, Annelies; Caymax, Matty; Heyns, Marc Journal: Physica status solidi Issue: Volume 254:Issue 4(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Ascertaining the Nature and Distribution of Extended Crystalline Defects in Emerging Semiconductor Materials Using Electron Channeling Contrast Imaging. (20th July 2018) Authors: Schulze, Andreas; Han, Han; Strakos, Libor; Vystavel, Tomas; Porret, Clement; Loo, Roger; Caymax, Matty Journal: ECS transactions Issue: Volume 86:Number 7(2018) Page Start: 387 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Atomically Controlled Processing for Dopant Segregation in CVD Si and Ge Epitaxial Growth. (1st January 2018) Authors: Murota, Junichi; Yamamoto, Yuji; Costina, Ioan; Tillack, Bernd; Thanh, Vinh Le; Loo, Roger; Caymax, Matty Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 6(2018) Page Start: P305 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Atomically Controlled Processing for Dopant Segregation in CVD Si and Ge Epitaxial Growth. (31st May 2018) Authors: Murota, Junichi; Yamamoto, Yuji; Costina, Ioan; Tillack, Bernd; Thanh, Vinh Le; Loo, Roger; Caymax, Matty Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 6(2018) Page Start: P305 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Controlled Sulfurization Process for the Synthesis of Large Area MoS2 Films and MoS2/WS2 Heterostructures. Issue 4 (16th December 2015) Authors: Chiappe, Daniele; Asselberghs, Inge; Sutar, Surajit; Iacovo, Serena; Afanas'ev, Valeri; Stesmans, Andre; Balaji, Yashwanth; Peters, Lisanne; Heyne, Markus; Mannarino, Manuel; Vandervorst, Wilfried; Sayan, Safak; Huyghebaert, Cedric; Caymax, Matty; Heyns, Marc; De Gendt, Stefan; Radu, Iuliana; The... Journal: Advanced materials interfaces Issue: Volume 3:Issue 4(2016) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM. (November 2021) Authors: Han, Han; Strakos, Libor; Hantschel, Thomas; Porret, Clement; Vystavel, Tomas; Loo, Roger; Caymax, Matty Journal: Micron Issue: Volume 150(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗