Author/Creator: Castellazzi, Alberto - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Castellazzi, Alberto

1. A Single Phase GaN GITs-Based Bidirectional Multilevel Inverter for High Voltage Grid Tied Photovoltaic Power System. Issue 8 (9th May 2023)

Authors:: Naveed, Muhammad Mohsin; Castellazzi, Alberto
Journal:: Electric power components and systems
Issue:: Volume 51:Issue 8(2023)
Page Start:: 769
Record Type:: Journal Article
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2. Combined experimental-FEM investigation of electrical ruggedness in double-sided cooled power modules. (November 2020)

Authors:: Scognamillo, Ciro; Catalano, Antonio Pio; Lasserre, Philippe; Duchesne, Cyrille; d'Alessandro, Vincenzo; Castellazzi, Alberto
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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3. Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. (September 2017)

Authors:: Oeder, Thorsten; Castellazzi, Alberto; Pfost, Martin
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 321
Record Type:: Journal Article
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4. Measuring structure functions of power devices in inverters. (December 2017)

Authors:: Aliyu, Attahir M.; Castellazzi, Alberto
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 395
Record Type:: Journal Article
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5. Modular integration of a matrix converter. Issue 1 (January 2016)

Authors:: Solomon, Adane Kassa; Skuriat, Robert; Castellazzi, Alberto; Wheeler, Pat
Journal:: IEEJ transactions on electrical and electronic engineering
Issue:: Volume 11:Issue 1(2016:Jan.)
Page Start:: 103
Record Type:: Journal Article
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6. Observer based dynamic adaptive cooling system for power modules. (March 2016)

Authors:: Wang, Xiang; Castellazzi, Alberto; Zanchetta, Pericle
Journal:: Microelectronics and reliability
Issue:: Volume 58(2016)
Page Start:: 113
Record Type:: Journal Article
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7. VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs. (September 2018)

Authors:: Asllani, Besar; Fayyaz, Asad; Castellazzi, Alberto; Morel, Hervé; Planson, Dominique
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 604
Record Type:: Journal Article
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