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Author/Creator Brunet, L.

3. Novel fine-grain back-bias assist techniques for 3D-monolithic 14 nm FDSOI top-tier SRAMs. (June 2020)

Authors:
Bosch, D.; Garros, X.; Makosiej, A.; Ciampolini, L.; Weber, O.; Lacord, J.; Cluzel, J.; Giraud, B.; Berthelon, R.; Cibrario, G.; Brunet, L.; Batude, P.; Fenouillet-Béranger, C.; Lattard, D.; Colinge, J.P.; Balestra, F.; Andrieu, F.
Journal:
Solid-state electronics
Issue:
Volume 168(2020)
Page Start:
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

6. FDSOI bottom MOSFETs stability versus top transistor thermal budget featuring 3D monolithic integration. (November 2015)

Authors:
Fenouillet-Beranger, C.; Previtali, B.; Batude, P.; Nemouchi, F.; Cassé, M.; Garros, X.; Tosti, L.; Rambal, N.; Lafond, D.; Dansas, H.; Pasini, L.; Brunet, L.; Deprat, F.; Grégoire, M.; Mellier, M.; Vinet, M.
Journal:
Solid-state electronics
Issue:
Volume 113(2015)
Page Start:
2
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

7. Deciphering the fine nucleotide diversity of full HLA class I and class II genes in a well‐documented population from sub‐Saharan Africa. (25th December 2017)

Authors:
Goeury, T.; Creary, L. E.; Brunet, L.; Galan, M.; Pasquier, M.; Kervaire, B.; Langaney, A.; Tiercy, J.‐M.; Fernández‐Viña, M. A.; Nunes, J. M.; Sanchez‐Mazas, A.
Journal:
HLA
Issue:
Volume 91:Number 1(2018)
Page Start:
36
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗