1. Curing defects in plasma-enhanced atomic layer deposition of Al2O3 by six methods. (December 2022) Authors: An, Jehyun; Choi, Kyeong-keun; Kang, Bohyeon; Baek, Rock-Hyun Journal: Materials science in semiconductor processing Issue: Volume 152(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Electron trapping and extraction kinetics on carrier diffusion in metal halide perovskite thin films. Issue 45 (25th September 2019) Authors: Kang, Gyeongho; Yoon, Jun-Sik; Kim, Guan-Woo; Choi, Kyoungwon; Park, Taiho; Baek, Rock-Hyun; Lim, Jongchul Journal: Journal of materials chemistry Issue: Volume 7:Issue 45(2019) Page Start: 25838 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. High-performance logic transistor DC benchmarking toward 7 nm technology-node between III–V and Si tri-gate n-MOSFETs using virtual-source injection velocity model. (February 2016) Authors: Baek, Rock-Hyun; Kim, Jin Su; Kim, Do-Kywn; Kim, Taewoo; Kim, Dae-Hyun Journal: Solid-state electronics Issue: Volume 116(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. High-performance logic transistor DC benchmarking toward 7 nm technology-node between III–V and Si tri-gate n-MOSFETs using virtual-source injection velocity model. (February 2016) Authors: Baek, Rock-Hyun; Kim, Jin Su; Kim, Do-Kywn; Kim, Taewoo; Kim, Dae-Hyun Journal: Solid-state electronics Issue: Volume 116(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Improved ISPP scheme for narrow threshold voltage distribution in 3-D NAND flash memory. (April 2023) Authors: Yang, Giho; Park, Chanyang; Nam, Kihoon; Kim, Donghyun; Park, Min Sang; Baek, Rock-Hyun Journal: Solid-state electronics Issue: Volume 202(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Learning-Based Ordering Characters on Ancient Document. (17th November 2022) Authors: Lee, Hyeonjin; Baek, Rock-Hyun; Choi, Hyun-Chul Other Names: Khan Asif Irshad Academic Editor. Journal: Computational intelligence and neuroscience Issue: Volume 2022(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Observation of mobility and velocity behaviors in ultra-scaled LG = 15 nm silicon nanowire field-effect transistors with different channel diameters. (February 2020) Authors: Lee, Seunghwan; Yoon, Jun-Sik; Jeong, Jinsu; Lee, Junjong; Baek, Rock-Hyun Journal: Solid-state electronics Issue: Volume 164(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Optimization of nanosheet number and width of multi-stacked nanosheet FETs for sub-7-nm node system on chip applications. (20th March 2019) Authors: Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Baek, Rock-Hyun Journal: Japanese journal of applied physics Issue: Volume 58:Number SB(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Origin of Incremental Step Pulse Programming (ISPP) slope degradation in charge trap nitride based multi-layer 3D NAND flash. (January 2021) Authors: Nam, Kihoon; Park, Chanyang; Yoon, Jun-Sik; Jang, Hyundong; Park, Min Sang; Sim, Jaesung; Baek, Rock-Hyun Journal: Solid-state electronics Issue: Volume 175(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Quantitative analysis of irregular channel shape effects on charge-trapping efficiency using massive 3D NAND data. (April 2023) Authors: Park, Chanyang; Yoon, Jun-Sik; Nam, Kihoon; Jang, Hyundong; Park, Min Sang; Baek, Rock-Hyun Journal: Materials science in semiconductor processing Issue: Volume 157(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗