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You searched for: Record Type Journal Article Author/Creator Andrieu, F.Limit your search
- Andrieu, F. [remove] 5
- 621.38152 3
- Semiconducteurs -- Périodiques 3
- Semiconductors -- Periodicals 3
- 3D monolithic -- FDSOI -- BTI stress -- Supply Read Retention Voltage (SRRV) -- SRAM margins -- SNM -- WNM -- Variability -- Body biasing -- SPICE -- Technology-design optimization 1
- 523 1
- 621.3815 1
- Appareils électroniques -- Fiabilité -- Périodiques 1
- Atmosphere, Upper -- Periodicals 1
- CMOS -- Ultra-Thin-Body and Buried-Oxide Fully-Depleted-On-Insulator (UTBB FDSOI) -- SiGe -- Stress -- Strain -- Layout effects -- Length of diffusion (LOD) -- SA/SB parameters -- Threshold voltage -- Mobility 1
- Electronic apparatus and appliances -- Reliability 1