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4. Etching-induced damage in heavily Mg-doped p-type GaN and its suppression by low-bias-power inductively coupled plasma-reactive ion etching. (13th January 2021)

7. Facet dependence of leakage current and carrier concentration in m‐plane GaN Schottky barrier diode fabricated with MOVPE (Phys. Status Solidi A 8∕2017). Issue 8 (14th August 2017)

8. Facet dependence of leakage current and carrier concentration in m‐plane GaN Schottky barrier diode fabricated with MOVPE. Issue 8 (4th July 2017)

10. Precise Measurement of Carrier Concentrations in n-Type GaN by Phase-Shifting Electron Holography. (August 2019)