Cite
MLA Citation
Matthias Meffert et al.. “(Invited) Capabilities of Analytical Transmission Electron Microscopy for the Analysis of Structural, Chemical and Electronic Properties Exemplified by the Study of Y-Doped (Ba, Sr)(Co, Fe)O3-δ.” ECS transactions, vol. 66, 2015, pp. 143–146. http://access.bl.uk/ark:/81055/vdc_100117131049.0x000010