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APA Citation
Meffert, M., Störmer, H., & Gerthsen, D. (2015). (Invited) Capabilities of Analytical Transmission Electron Microscopy for the Analysis of Structural, Chemical and Electronic Properties Exemplified by the Study of Y-Doped (Ba, Sr)(Co, Fe)O3-δ. ECS transactions, 66, 143–146. http://access.bl.uk/ark:/81055/vdc_100117131049.0x000010