Cite

MLA Citation

    A Kravtsov and G Chikvaidze. “Experimental verification of the of contamination reduction of silicon during electron beam melting due to the use of a gas-dynamic window.” IOP conference series, vol. 1100, no. 1, 2021, p. . http://access.bl.uk/ark:/81055/vdc_100123126136.0x000007
  
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