Cite
HARVARD Citation
Kravtsov, A. et al. (2021). Experimental verification of the of contamination reduction of silicon during electron beam melting due to the use of a gas-dynamic window. IOP conference series. 1100 (1), p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Kravtsov, A. et al. (2021). Experimental verification of the of contamination reduction of silicon during electron beam melting due to the use of a gas-dynamic window. IOP conference series. 1100 (1), p. . [Online].