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APA Citation
Feng, Z. C., Lin, H., Xin, B., Tsai, S., Saravade, V., Yiin, J., Klein, B., & Ferguson, I. T. (2023). structural characteristics of 3C–SiC thin films grown on Si-face and C-face 4H–SiC substrates by high temperature chemical vapor deposition. Vacuum, 207, . http://access.bl.uk/ark:/81055/vdc_100170508067.0x000051