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HARVARD Citation
Feng, Z. et al. (2023). Structural characteristics of 3C–SiC thin films grown on Si-face and C-face 4H–SiC substrates by high temperature chemical vapor deposition. Vacuum. p. . [Online].
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Feng, Z. et al. (2023). Structural characteristics of 3C–SiC thin films grown on Si-face and C-face 4H–SiC substrates by high temperature chemical vapor deposition. Vacuum. p. . [Online].