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APA Citation
De Santi, C., Nardo, A., Wong, M., Goto, K., Kuramata, A., Yamakoshi, S., Murakami, H., Kumagai, Y., Higashiwaki, M., Meneghesso, G., Zanoni, E., & Meneghini, M. (2019). stability and degradation of isolation and surface in Ga2O3 devices. Microelectronics and reliability, 100, . http://access.bl.uk/ark:/81055/vdc_100098420346.0x00005a