Cite
MLA Citation
Dinh Van Quy and Kazuo Kondo. “Retraction: Low Thermal Expansion Coefficient Electrodeposited Copper and Its Contraction Mechanism by Annealing [J. Electrochem. Soc., 164, D150 (2017)].” Journal of the Electrochemical Society, vol. 164, no. 7, 2017, p. X16. http://access.bl.uk/ark:/81055/vdc_100160140018.0x00001d