Retraction: Low Thermal Expansion Coefficient Electrodeposited Copper and Its Contraction Mechanism by Annealing [J. Electrochem. Soc., 164, D150 (2017)]. Issue 7 (1st January 2017)

Record Type:: Journal Article
Title:: Retraction: Low Thermal Expansion Coefficient Electrodeposited Copper and Its Contraction Mechanism by Annealing [J. Electrochem. Soc., 164, D150 (2017)]. Issue 7 (1st January 2017)
Main Title:: Retraction: Low Thermal Expansion Coefficient Electrodeposited Copper and Its Contraction Mechanism by Annealing [J. Electrochem. Soc., 164, D150 (2017)]
Authors:: Van Quy, Dinh
Kondo, Kazuo
Abstract:
Is Part Of:: Journal of the Electrochemical Society. Volume 164:Issue 7(2017)
Journal:: Journal of the Electrochemical Society
Issue:: Volume 164:Issue 7(2017)
Issue Display:: Volume 164, Issue 7 (2017)
Year:: 2017
Volume:: 164
Issue:: 7
Issue Sort Value:: 2017-0164-0007-0000
Page Start:: X16
Page End:: X16
Publication Date:: 2017-01-01
Subjects:: Erratum
Electrochemistry -- Periodicals
541.3705
Journal URLs:: https://iopscience.iop.org/journal/1945-7111?gclid=EAIaIQobChMI4Y-UmqGC7wIVFeDtCh0VQAo7EAAYASAAEgLW8_D_BwE ↗
DOI:: 10.1149/2.1391707jes ↗
Languages:: English
ISSNs:: 0013-4651
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 22790.xml