Cite
MLA Citation
Sathish Kumar Dhayalan et al.. “Insights into the C Distribution in Si:C/Si:C:P and the Annealing Behavior of Si:C Layers.” ECS journal of solid state science and technology, vol. 8, 2019, pp. P209–P216. http://access.bl.uk/ark:/81055/vdc_100160135456.0x00000c