Cite
MLA Citation
Manoj Nag et al.. “Impact of the Low Temperature Gate Dielectrics on Device Performance and Bias-Stress Stabilities of a-IGZO Thin-Film Transistors.” ECS journal of solid state science and technology, vol. 4, 2015, pp. N99–N102. http://access.bl.uk/ark:/81055/vdc_100160133156.0x000004