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APA Citation
Nag, M., Bhoolokam, A., Steudel, S., Genoe, J., Groeseneken, G., & Heremans, P. (2015). impact of the Low Temperature Gate Dielectrics on Device Performance and Bias-Stress Stabilities of a-IGZO Thin-Film Transistors. ECS journal of solid state science and technology, 4, N99–N102. http://access.bl.uk/ark:/81055/vdc_100160133156.0x000004