Cite
MLA Citation
P. Malviya et al.. “A differential OTP memory based highly unique and reliable PUF at 180 nm technology node.” Solid-state electronics, vol. 188, 2022, p. . http://access.bl.uk/ark:/81055/vdc_100148220441.0x000051
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P. Malviya et al.. “A differential OTP memory based highly unique and reliable PUF at 180 nm technology node.” Solid-state electronics, vol. 188, 2022, p. . http://access.bl.uk/ark:/81055/vdc_100148220441.0x000051