Cite
APA Citation
Blumer, A. N., Boyer, J. T., Deitz, J. I., Rodriguez, F. A., & Grassman, T. J. (n.d.). quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis. Microscopy and microanalysis, 25, 202–203. http://access.bl.uk/ark:/81055/vdc_100145643290.0x000041